Description:
The measurements are performed using the total integrated scattering measurement station with nanosecond laser Ekspla NL202. Scatter is measured in relation to the OceanOptics standard. Measurement accuracy: scatter of background is 1.4x10-5 (355 nm) and 4.5 x 10-6 (532 nm). Roughness can be measured from 0.5 to 10 nm. The station can perform scattering loss measurements on samples with a diameter from 12.7 to 28 mm and thickness from 2 to 6 mm.
Application:
Evaluation of total integrated scattering from the whole surface of different optical elements (mirrors, filters, optical substrates, radial polarization converters) and surface roughness for mirrors, optical substrates, filters etc., which are designed for 1064nm, 532 nm and 355 nm laser radiation.
Remarks on tariffs:
a) tariffs of OAC staff are not included (contribution of OAC staff to the total cost depends on the complexity of measurements);
b) the price correspond to the price of the one-hour standard measurement;
c) the discount of 50 % applies to users performing joint projects with the University of Vilnius Department of Quantum Electronics. Salary and costs of devices consumables have to be included in projects.
R&D Services 
